Modern X-ray tomography techniques, combining a mixture of advanced experimental imaging and novel mathematical reconstruction methods, are a topic of intensive study where many advances are currently made. After obtaining the 3D images, the next step forward is constituted by the determination of quantitative parameters describing the phenomenon under investigation.
The main goal of this workshop is to initiate a thorough discussion about the extraction of quantitative object features based on 3D X-ray imaging. For certain basic cases of dimensional metrology protocols for quantitative CT-based measurements have already been established, but for the more elaborate X-ray tomography techniques, evaluation of images is currently often a qualitative procedure.
We will focus on three key domains, each giving rise to unique and specific metrology and quantification questions: (i) Dimensional metrology, (ii) Quantification of dynamic processes, and (iii) Quantitative X-ray orientation imaging.
The program will consist of a series of broad lectures by prominent researchers in the morning sessions, and in-depth group discussions on the three topics in the afternoons.